CCN at DesignCon 2019

Dr. Don DeGroot of CCN is co-presenting DesignCon 2019 talk on Dk/Df testing - Apples-to-Apples PCB Laminate Characterization. Don coauthored the presentation with Bill Hargin of Z-Zero and Bret Moreland of CCN. The talk and associated paper demonstrate the need for dielectric testing to evaluate a variety of copper clad laminates for a specific high-speed designs, AND the need for dielectric testing in controlling supplier materials after design selection. Join us Wed. Jan. 30 in Ballroom D of the Santa Clara Convention Center to learn of expedient solutions to testing dielectric constant and loss tangent of CCLs for material selection in design and supply chain monitoring in manufacturing.