Dr. Don DeGroot of CCN is co-presenting DesignCon 2019 talk on Dk/Df testing - Apples-to-Apples PCB Laminate Characterization. Don coauthored the presentation with Bill Hargin of Z-Zero and Bret Moreland of CCN. The talk and associated paper demonstrate the need for dielectric testing to evaluate a variety of copper clad laminates for a specific high-speed designs, AND the need for dielectric testing in controlling supplier materials after design selection. Join us Wed. Jan. 30 in Ballroom D of the Santa Clara Convention Center to learn of expedient solutions to testing dielectric constant and loss tangent of CCLs for material selection in design and supply chain monitoring in manufacturing.
Company and industry news items related to Signal Integrity and RF test and measurement.