Join us in the Chiphead Theater at DesignCon 2016 on Wednesday, January 20 at 1:00 p.m. for the presentation, "How do they come up with those data sheet values." Dr. Don DeGroot of CCN will be joining other industry experts in revealing the truth behind dielectric material specifications and their source.

At DesignCon, Thursday, January 21 at 8:30 a.m., in Ballroom E, Dr. Eric Bogatin of Teledyne LeCroy will be presenting an important new measurement technique for testing signal delay variations in fabricated circuit boards.

CCN proudly provided laboratory and instrument support to this research of the University of Colorado and NanYa. Join us to learn about the new technique and see CCN's nTegrity fixture applied to precise delay skew measurements.

Dr. Don DeGroot of CCN will be participating at DesignCon 2016 in the Panel Presentation and Discussion, "Round Robin of High Frequency Test Methods." The Panel is chaired by Glen Oliver of DuPont and includes John Coonrod of Rogers Corporation and David Wynants of Taconic.

The panel, which will be hosted on Wednesday, January 20, 3:45 p.m. in Ballroom E, will present recent results from a dielectric material round-robin test being conducted by the IPC D24c TaskGroup. The panel participants will show the results collected and describe the methods in use.

​The discussion will center on the relation between manufacturers' specifications, the results from standard test methods, and the level of accuracy required by designers.